The use of a Ga+ focused ion beam to modify graphene for device applications

Citation:

B. S. Archanjo, et al., “The use of a Ga+ focused ion beam to modify graphene for device applications,” Nanotechnology, vol. 23, no. 25, 2012.

Date Published:

Jun 29

Notes:

Jorio, Ado/F-2141-2010; Malard, Leandro/B-2292-2013; Neves, Bernardo/B-9818-2013; Medicina Molecular, Inct/J-8737-2013; Almeida, Clara/M-2236-2013; Maciel, Indhira/C-1832-2014; Martins Ferreira, Erlon/H-6829-2014; Brant, Juliana/I-7585-2014; Maciel, Indhira/C-2580-2011; Fragneaud, Benjamin/C-3810-2016;Carozo, Victor/0000-0002-0751-6435; Brant, Juliana/0000-0002-8931-3403; Fragneaud, Benjamin/0000-0001-8170-6117; Archanjo, Braulio/0000-0001-8145-771212

Website

Last updated on 06/01/2016