Sathyavathi R, Saha A, Soares JS, Spegazzini N, McGee S, Rao Dasari R, Fitzmaurice M, Barman I. Raman spectroscopic sensing of carbonate intercalation in breast microcalcifications at stereotactic biopsy. Scientific Reports [Internet]. 2015;5 :9907 EP -. Publisher's Version
Alencar AB, Barboza APM, Archanjo BS, Chacham H, Neves BRA. Experimental and theoretical investigations of monolayer and few-layer talc. 2d Materials [Internet]. 2015;2 (1). Publisher's Version
Oliveira CK, Gomes EFA, Prado MC, Alencar TV, Nascimento R, Malard LM, Batista RJC, Oliveira AB, Chacham H, de Paula AM, et al. Crystal-oriented wrinkles with origami-type junctions in few-layer hexagonal boron nitride. Nano Research [Internet]. 2015;8 (5) :1680-1688. Publisher's Version
Nascimento R, da Martins JR, Batista RJC, Chacham H. Band Gaps of BN-Doped Graphene: Fluctuations, Trends, and Bounds. Journal of Physical Chemistry C [Internet]. 2015;119 (9) :5055-5061. Publisher's Version
Manhabosco SM, Batista RJC, Neves da Silva S, Dick LFP. DETERMINATION OF CURRENT MAPS BY SVET OF HOT-DIP GALVANIZED STEEL UNDER SIMULTANEOUS STRAINING. Electrochimica Acta [Internet]. 2015;168 :89-96. Publisher's Version
Araujo KAS, Barboza APM, Fernandes TFD, Shadmi N, Joselevich E, Mazzoni MSC, Neves BRA. Charge transfer between carbon nanotubes on surfaces. Nanoscale [Internet]. 2015;7 (39) :16175-16181. Publisher's Version
de Lima AL, Muessnich LAM, Manhabosco TM, Chacham H, Batista RJC, Oliveira AB. Soliton instability and fold formation in laterally compressed graphene. Nanotechnology [Internet]. 2015;26 (4). Publisher's Version
Prado MC, Nascimento R, Faria BEN, Matos MJS, Chacham H, Neves BRA. Nanometre-scale identification of grain boundaries in MoS 2 through molecular decoration. Nanotechnology [Internet]. 2015;26 (47) :475702. Publisher's VersionAbstract
In this paper, we address the challenge of identifying grain boundaries on the molybdenum disulphide (MoS 2 ) surface at the nanometre scale using a simple self-assembled monolayer (SAM) decoration method. Combined with atomic force microscopy, octadecylphosphonic acid monolayers readily reveal grain boundaries in MoS 2 at ambient conditions, without the need of atomic resolution measurements under vacuum. Additional ab initio calculations allow us to obtain the preferred orientation of the SAM structure relative to the MoS 2 beneath, and therefore, together with the experiments, the MoS 2 crystalline orientations at the grain boundaries. The proposed method enables the visualization of grain boundaries with sub-micrometer resolution for nanodevice investigation and failure analysis.